Failure Analysis
Main Business Support
-
- Semiconductor Failure Analysis (Semiconductor Analysis)
-
Delamination, Voids, Package crack, Die crack, White bump, Pattern Short, De-wetting, Via Hole, Migration Analysis,
Whisker Analysis etc.
-
- Material Failure Analysis
-
Metallic compound, Solder crack, Solder Defect, Pattern, Via Hole, Cross-section, De-wetting, Lift-off, Component analysis,
Grain analysis, Material Analysis etc.
-
- PCB Component Failure Analysis (PCB Analysis)
-
Bond test, Push-Pull test, Fracture test etc.
-
- Solderability Analysis (Solderability Analysis)
-
Component Analysis, Pattern/BGA Short, Voids Area Analysis etc.
01 Business Support: Test Fields and Applied Standards
| Test Field | Application Specifications |
|---|---|
| Shape Analysis |
- Microstructure and Structural Analysis of Materials Using Microscopic Equipment - 2D/3D defective analysis using X-ray - Sample pre-treatment and cross-sectional analysis for junction assessment |
| Physical Analysis | Evaluation of mechanical properties of Push/Pull/Shear, component analysis of organic/inorganic materials |
| Ultrasound analysis | Delamination analysis of surface and internal defects of materials |
| Hyper-accelerated stress test | Provides reliability evaluation in a short time by accelerating test conditions |
| Test Field | Applicable specification |
|---|---|
| Hyundai/Kia Motors [ES] |
ES90000-01, 02, 03, 04, 05, 06, ES39220-06, ES91101-00, ES95400-10, ES97110-03, ES91500-00, 02, 03, ES95910-93 etc. |
| Ssangyong Motors [SES] | SES-E 011-04, SES-E 950, SES-E 060-07, etc. |
| GMW | GMW3172, GMW3286, GMW14872, GMW3431, GMW14834 etc. |
| Ultra-accelerated stress tests | BMW (GS), Peugeot (PSA), Volkswagen (VW), Toyota (TSC), Nissan (NDS, NES), etc. |
02 Main Test Equipment
-
- 3D Digital Optical Microscope
- (Optical Microscope)
-
- SEM-EDS Electron Microscope
- (Scanning Electron Microscope)
(Energy Dispersive Spectrometer)
-
- Ultrasonic SAT
- (Scanning Acoustic Microscope)
-
- Bonding Strength Tester
- (Bond tester)
-
- 3D X-ray/CT
